Measuring and mapping the global burden of antimicrobial resistance

Hay SI., Rao PC., Dolecek C., Day NPJ., Stergachis A., Lopez AD., Murray CJL.

DOI

10.1186/s12916-018-1073-z

Type

Journal article

Publisher

Springer Science and Business Media LLC

Publication Date

2018-12-01T00:00:00+00:00

Volume

16

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